Microscopy & Microtechniques
Enhanced Functionality for Excellent Performance – The Olympus LEXT OLS4000 Optical Metrology Instrument
Jul 26 2010
The LEXT OLS4000 confocal laser scanning microscope metrology system brings a number of additional features and enhanced functionality, including near-vertical slope capabilities, larger optical zoom and navigation overview window. The new software also brings even the most complex of processes within easy reach of a broader range of users, with the use of different user interface sheets for the main tasks –acquisition, analysis and reporting. As well as these internal functional improvements, the whole system has a sleeker look and now only requires a single control unit. The LEXT OLS4000 not only matches the challenges of the measurement laboratory, but also leads the way in establishing optical technology as the most flexible measurement systems available – Optical Metrology. Olympus.
Digital Edition
ILM 49.5 July
July 2024
Chromatography Articles - Understanding PFAS: Analysis and Implications Mass Spectrometry & Spectroscopy Articles - MS detection of Alzheimer’s blood-based biomarkers LIMS - Essent...
View all digital editions
Events
Jul 30 2024 Jakarta, Indonesia
Jul 31 2024 Chengdu, China
ACS National Meeting - Fall 2024
Aug 18 2024 Denver, CO, USA
Aug 25 2024 Copenhagen, Denmark
Aug 28 2024 Phnom Penh, Cambodia