Microscopy & Microtechniques
TXRF Advantages at a Glance
May 04 2011
The ever growing number of applications and the necessity to present the advantages of total reflection X-ray spectrometry (TXRF) effectively, has led to a complete redesign of the S2 PICOFOX TXRF spectrometer section of the Bruker Homepage. On the new pages you will find easy access to
• Instrument technology and specifications,
• Applications and lab reports, and the
• Highlight: Sample preparation.
One of the key advantages of the S2 PICOFOX is the easy sample preparation compared to other trace analysis methods like ICP and AAS. This has been illustrated by showing you the steps required for different sample categories, like liquids, solids, thin layers, particles, plant materials, tissue, etc. Visit our new web pages and learn how TXRF spectrometry can help you save time and effort in trace element analysis, especially when using an instrument like the S2 PICOFOX. This unique spectrometer features versatility, low detection limits and simultaneous multi-element analysis in combination with a small footprint, portability, low energy consumption – and above all – reliable and fast results.
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