Chromatography
Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2
Apr 10 2008
Controlling PCD/CVD, galvanised steels, oxide films etc, or studying corrosion mechanisms? RF Glow Discharge Optical Emission Spectrometry
provides quantitative depth profiles from the first atomic layers down to the bulk (more than 150 microns) with sputtering rates typically 1000 times faster than other surface techniques.
For more information contact Horiba Jobin Yvon
Digital Edition
ILM 49.5 July
July 2024
Chromatography Articles - Understanding PFAS: Analysis and Implications Mass Spectrometry & Spectroscopy Articles - MS detection of Alzheimer’s blood-based biomarkers LIMS - Essent...
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Events
Jul 28 2024 San Diego, CA USA
Jul 30 2024 Jakarta, Indonesia
Jul 31 2024 Chengdu, China
ACS National Meeting - Fall 2024
Aug 18 2024 Denver, CO, USA
Aug 25 2024 Copenhagen, Denmark