Microscopy & Microtechniques
A Level Playing Field for EBSD Analysis of Crystalline Materials
Dec 17 2009
Author: Dave Prior1, John Gilbert2 and Dick Paden2 on behalf of Unassigned Independent Article
Electron BackScatter Diffraction (EBSD) is a rapidly growing addition to the battery of techniques routinely employed by scanning electron microscope users, producing an electron backscattering pattern (EBSP) that
relates exactly to the crystal structure and orientation of the sample under examination. Although the first EBSP was published by Nishikawa and Kikuchi in 1928, many would correlate its growing popularity with the rise of
the scanning electron microscope (SEM) since its commercial introduction in 1965. By 1967, Coates was describing observation of Pseudo Kikuchi lines in work that led directly to selected area electron channelling patterns (SAECP). In this technique, the electron beam is rocked from side-to-side over a point on a horizontal sample surface and a map of the intensity of backscattered electrons generated. Although the angular resolution of SACP is superior to EBSD, two main drawbacks exist: a fundamentally low resolution of 5 μm and a complex electron optical configuration.
Digital Edition
ILM 49.5 July
July 2024
Chromatography Articles - Understanding PFAS: Analysis and Implications Mass Spectrometry & Spectroscopy Articles - MS detection of Alzheimer’s blood-based biomarkers LIMS - Essent...
View all digital editions
Events
Jul 28 2024 San Diego, CA USA
Jul 30 2024 Jakarta, Indonesia
Jul 31 2024 Chengdu, China
ACS National Meeting - Fall 2024
Aug 18 2024 Denver, CO, USA
Aug 25 2024 Copenhagen, Denmark